Nauka innov. 2012, 8(2):13–16
https://doi.org/10.15407/scin8.02.013

S.О. Firstov, M.І. Danylenko
I. M. Frantsevich Institute for Problems of Materials Sciences NAS of Ukraine, Kiev

Mechanical Preparation of Samples for Electron Microscopy Studying

Section: The World of Innovations
Language: Russian
Abstract: Different types of thin foils produced by an electrochemical polishing are considered. The necessity of ion milling application in study of material structure and chemical composition by methods of analytical electronic microscopy is shown. Within the framework of the Program on a scientific instrument-making at the Presidium of NAS of Ukraine the devices for mechanical preparation of blanks before ion milling finishing were developed and manufactured.
Key words: analytical transmission electron microscopy, mechanical preparation of samples, dimpler, ion milling.